D08700 - SEMI D87 - Test Method for Response Time Evaluation of Displays with Variable Refresh Rate Revision:SEMI D87-0125 - Current SEMI E54-0413 (designation update)

SEMI E54-0413 (designation update)

in both characteristic shape and magnitude

2 本方法一般用於FPD生產中以測試彩色濾光片之耐熱性。 2

FOBITは，次の300 mmのスタンダードと互換性がある。

SEMI G13-84 (technical revision)

D08700 - SEMI D87 - Test Method for Response Time Evaluation of Displays with Variable Refresh Rate Revision:SEMI D87-0125 - Current SEMI E54-0413 (designation update)1 Purpose 1. 1 The performance of the response time affects the moving image quality of the display. 1. 2 The new measurement methods propose to measure the response time characteristics at various frame frequencies. 2 Scope 2. 1 This Standard is applicable to the color image display devices with variable refresh rates. Referenced SEMI Standards (purchase separately) None. Revision History SEMI D87 0125 (first published)