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This Standard specifies measurement conditions and methods for describing the visual color quality in three-dimensional (3D) color space
SEMI E40-0813 (designation update)
SEMI PV23 — Test Method for Mechanical Vibration of Crystalline Silicon Photovoltaic (PV) Modules in Shipping Environment
which are technology specific
the requirements are presented as guides
M01700 - SEMI M17 - Guide for a Universal Wafer Grid StdPbc-0915 This Standard specifies measurement conditionsMaximum allowable slip and other non uniformly distributed defects are frequently specified when procuring polished and epitaxial silicon wafers. SEMI M62 specifies a maximum allowable fraction of the epitaxial wafer surface area that can contain slip. This Guide provides a design for and guidance for use of a wafer grid that facilitates the determination of the fraction of the wafer surface area covered by observed defects. This Guide defines a grid
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